SSR MARKER FOR GRAIN YIELD UNDER HEAT STRESS CONDITIONS IN BREAD WHEAT
Abstract
In the present study, we developed a set of bread wheat RILs to be used in the future in wheat breeding programs using SSD method. To achieve this, a cross between the two parents Giza-168 and Shandaweel-1 was employed in 2011 winter season to produce F1 seeds. The F1 seeds were grown and allowed to self-pollinate until F6. Then, seeds from the individual plants were bulked to create 100 advanced lines of bread wheat (100 F7 RILs). All genotypes were then sown under normal and heat stress conditions in 2018 winter season and the yield components were evaluated. All yield components were decreased under heat stress conditions in all tested genotypes, however, GYS for some RILs was higher than those of the higher parent (Shandaweel-1) under heat stress conditions. On the hand, five SSR primers were used to develop SSR markers for grain yield under heat stress conditions using the two parents and the highest and lowest five RILs regard to their performance according to GYS under heat stress conditions. Only one marker (Xwmc626) successfully generated unique specific band (420 bp) only in the higher parent (Shandaweel-1) and the highest RILs regard to GYS under heat stress conditions, suggesting that this band can be considered as SSR marker associated with GYS under heat stress conditions in wheat. There is no conflict of interest with any financial organization regarding this study.References
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